Yield

This material covers the topic of Yield Analysis and Modeling. Yield is a critical aspect of the semiconductor manufacturing process. High yielding components are necessary for profits and success at Foundries as well as the Integrated Device Manufacturers. This material covers the Principles and Procedures of Yield Analysis, Yield Analysis Techniques, Yield Modeling, Data Mining, and Yield Enhancement Techniques.

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Introduction

Presentations

Yield Calculator

Yield Estimator

Documents

NONE

Videos

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Models

Models are an important component of the yield analysis problem. We need models to predict not only the yield of new products, but also provide clues as to what types of problems might be occurring with a wafer lot or group of lots. This course covers general models for yield like the Poisson Yield Model, the Seeds Model and others. It also covers various techniques and approaches to predicting yield based on measured electrical and physical parameters.

Presentations

Introduction to Yield Analysis

Advanced Yield Modeling

Basic Yield Models

Critical Area Analysis

Data Mining Statistics and Plotting

Defect Analysis and Yield Loss

Documents

NONE

Videos

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Procedures

This course material covers the procedures associated with Yield Analysis. We cover procedures and methods that are used to help improve yield. These can be techniques used at the design level as well as techniques to address yield problems that are currently occurring.

Presentations

Yield Analysis Principles and Procedures

Yield Analysis Tools and Techniques

Yield Enhancement Techniques - Proactive

Yield Enhancement Techniques - Reactive

Yield Methods for Low Volume Manufacturing

Root Cause Analysis

Outlier Screening

Documents

Yield Analysis Principles and Procedures

Yield Analysis Tools and Techniques

Yield Enhancement Techniques - Proactive

Yield Enhancement Techniques - Reactive

Root Cause Analysis

Outlier Screening

Videos

NONE