Fundamentals of Yield (Online Version)

Low yields on a high volume manufacturing line can cost a company millions of dollars a day. Your industry needs competent analysts to help solve these problems. Fundamentals of Yield is an online course that offers detailed instruction on a variety of effective tools, as well as the overall process flow for identifying, locating and characterizing the defects responsible for the low yields. This course is designed for every manager, engineer, and technician working in the semiconductor field, using semiconductor components or supplying tools to the industry.

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Item

1-Year Online Training Subscription
(Includes this and other materials.)

Cost

$500

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Please fax the printable registration form for online training to us at 1-866-205-0713 to complete your order.

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Interested in a version of this course where you can ask questions in real time? Public and In-House versions of this course are available!

What Will I Learn By Taking This Class?

Registrants learn to develop the skills to determine what tools and techniques should be applied, and when they should be applied. This skill-building series is divided into three segments:

  1. The Process of Yield Analysis. Registrants learn to recognize correct philosophical principles that lead to a successful analysis. This includes concepts like destructive vs. non-destructive techniques, fast techniques vs. brute force techniques, and correct verification.
  2. Data Mining Techniques. Registrants learn the strengths and weaknesses of data mining tools used for analysis, including electrical testing techniques, defect inspection tools, wafer map data, and correlation techniques.
  3. Case Histories. Registrants identify how to use their knowledge through the case histories. They learn to identify key pieces of information that allow them to determine the possible cause of failure and how to proceed.

The class focuses on practical application to the situations that you face daily, whether you are a manager, an engineer, or a technician working in the semiconductor field, using semiconductor components, or supplying tools to the semiconductor industry.

Course Objectives

  1. This course will provide participants with an in-depth understanding of the tools, techniques, and processes used in yield analysis.
  2. Registrants will be able to determine how to proceed with a submitted request for analysis, ensuring that the analysis is done with the greatest probability of success.
  3. This course will identify the advantages and disadvantages of a wide variety of tools and techniques that are used for yield analysis.
  4. This course offers a wide variety of video demonstrations of analysis techniques, so the analyst can get an understanding of the types of results they might expect to see with their equipment.
  5. Registrants will be able to identify basic yield models and equations and their applicability to a variety of semiconductor devices.
  6. Registrants will be able to identify a variety of different failure mechanisms and how they manifest themselves.
  7. Registrants will be able to identify appropriate tools to purchase when starting or expanding a laboratory.

Course Outline

Models

Courses

  1. Introduction to Yield Analysis
  2. Advanced Yield Modeling
  3. Basic Yield Models
  4. Critical Area Analysis
  5. Data Mining Statistics and Plotting
  6. Defect Analysis and Yield Loss

Procedures

Courses

  1. Yield Analysis Principles and Procedures
  2. Yield Analysis Tools and Techniques
  3. Yield Enhancement Techniques - Proactive
  4. Yield Enhancement Techniques - Reactive
  5. Yield Methods for Low Volume Manufacturing
  6. Root Cause Analysis
  7. Outlier Screening

Documents

  1. Yield Analysis Principles and Procedures
  2. Yield Analysis Tools and Techniques
  3. Yield Enhancement Techniques - Proactive
  4. Yield Enhancement Techniques - Reactive
  5. Root Cause Analysis
  6. Outlier Screening