System Maintenance occurs every Friday.
System Maintenance occurs every Friday.
This material covers the topic of Yield Analysis and Modeling. Yield is a critical aspect of the semiconductor manufacturing process. High yielding components are necessary for profits and success at Foundries as well as the Integrated Device Manufacturers. This material covers the Principles and Procedures of Yield Analysis, Yield Analysis Techniques, Yield Modeling, Data Mining, and Yield Enhancement Techniques.
$700
Please email the printable registration form for online training to us at the email address on the form to complete your order.
Yield Calculator
Yield Estimator
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Models are an important component of the yield analysis problem. We need models to predict not only the yield of new products, but also provide clues as to what types of problems might be occurring with a wafer lot or group of lots. This course covers general models for yield like the Poisson Yield Model, the Seeds Model and others. It also covers various techniques and approaches to predicting yield based on measured electrical and physical parameters.
Introduction to Yield Analysis
Advanced Yield Modeling
Basic Yield Models
Critical Area Analysis
Data Mining Statistics and Plotting
Defect Analysis and Yield Loss
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This course material covers the procedures associated with Yield Analysis. We cover procedures and methods that are used to help improve yield. These can be techniques used at the design level as well as techniques to address yield problems that are currently occurring.
Yield Analysis Principles and Procedures
Yield Analysis Tools and Techniques
Yield Enhancement Techniques - Proactive
Yield Enhancement Techniques - Reactive
Yield Methods for Low Volume Manufacturing
Root Cause Analysis
Outlier Screening
Yield Analysis Principles and Procedures
Yield Analysis Tools and Techniques
Yield Enhancement Techniques - Proactive
Yield Enhancement Techniques - Reactive
Root Cause Analysis
Outlier Screening
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