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Reliability is defined as the intrinsic "goodness" of a component, and implies that a component will work according to its specification for some defined period of time. In order to understand reliability, one must have a basic understanding of the following items: Reliability Terms and Definitions, Statistics and Distributions, Failure Mechanisms (die level, package level, system level, and use conditions), Test equipment, Test structures and Accelerated testing techniques.
This material covers these six topics in detail, including reliability terms, statistics and distributions, calculating reliability, test equipment and structures, and the methods for determining the operational (and non-operational) lifetime of a microsystem. It also covers the physics and the methods used for determining the various mechanisms that can cause performance degradation.
$700
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Reliability is an important aspect of semiconductor design and manufacturing. Customers expect devices to work correctly through the expected life of the component. In some applications like medical implants, defense, and space, the consequence of failure is enormous. This requires extra attention to reliability. This material introduces the subject of reliability to the engineer/scientist.
Introduction to Semiconductor Reliability
Quality for Reliability Overview
Quality and Reliability
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Design for Reliability is increasingly a part of the design engineer's activities. Design for Reliability is the process of ensuring that major failure mechanisms will have minimal impact on the overall operation of the integrated circuit. Design for Reliability occurs at all levels of the process, from the transistors all the way up to the core or chip level. These presentations provide an overview of the Design for Reliability process.
Design for Reliability - Introduction
Design for Reliability - Transistor Level
Design for Reliability - Library Level
Design for Reliability - Micro Architecture Level
Design for Reliability - Core Chip Level
Design for Reliability - Introduction
Design for Reliability - Transistor Level
Design for Reliability - Library Level
Design for Reliability - Core Chip Level
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