System Maintenance occurs every Friday.
System Maintenance occurs every Friday.
Product Qualification is the group of activities that semiconductor manufacturers perform to demonstrate to their customers that their devices will be fit for the use to which they were designed. These activities are primarily testing activities, designed to demonstrate that the device will meet its physical dimensions, electrical characteristics, and reliability projections. We discuss these activities, and the standards by which we perform Product Qualification, in this classroom.
$700
Please email the printable registration form for online training to us at the email address on the form to complete your order.
Qualification is an important activity for product and reliability engineers. In order for the industry to be comfortable using a component, they decided to create several standards, allowing semiconductor manufacturers and users to "agree" on what constitutes a qualified product. We discuss those standards in this course.
Product Qualification Overview
MIL STD Qualification
Failure Mechanism Driven Qualification
Stress Driven Qualification
AEC Q100 Qualification
Knowledge Based Qualification
JEDEC Tests - Part 1
JEDEC Tests - Part 2
JEDEC Tests - Part 3
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Testing is a key aspect of reliability evaluations. Testing must be performed not only for individual failure mechanisms, but also at the component level. Component level testing helps ensure that all potential failure mechanisms are addressed. There are two types of testing at the component level: electrical screens and stress/life tests. Electrical screens are performed using automated test systems and are similar to standard functional tests. Stress and life tests are performed over longer periods of time under accelerated conditions. These conditions could be higher voltage levels, higher temperatures, high humidity levels, or a combination of each.
In order to make an accurate prediction concerning the reliability of a component or system, one must have data on the behavior of the system, or its individual components or failure mechanisms. While these can be estimated based on other experiments or data, it is best to gather data from the system, components, or surrogate test structures directly. This material describes test structures, test equipment, and the type of tests that are performed to generate reliability data. It includes material on burn-in, humidity testing, thermal cycling, and other types of accelerated testing.
Developing Electrical Screens
Developing Stress Tests and Life Tests
JEDEC Tests - Part 1
JEDEC Tests - Part 2
JEDEC Tests - Part 3
Quiz: Reliability Testing
Reliability Testing Certificate
Screens, Stress Tests and Life Tests
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