Education and Training for the Electronics Industry
Semitracks provides education, training, and certification services and products for the electronics industry. We specialize in serving Semiconductor, Microsystems and Nanotechnology suppliers and users. Semitracks, Inc. helps engineers, technicians, scientists, and management understand these dynamic fields. We offer courses in Semiconductor Reliability, Test, Packaging, Process Integration, Failure and Yield Analysis, and Focused Ion Beam technology. Learn from the Experts.
Here is an example of the basic circuit edit procedure on an integrated circuit from the top side. This is a three-level metal technology, so most interconnect segments can be reached easily. In this procedure, we wish to connect the metal-2 segment to the metal-1 segment contacting the left n+ implant in the n-channel transistor. First, we mill connections to the metal segments that we wish to connect. Next, we fill those holes with a conductive metal. In most FIB systems, this will be either be platinum or tungsten. For the purposes of the examples in this section, let's assume we are depositing tungsten. Finally, we strap the two plugs together by depositing a layer of tungsten on the surface. This action completes the connection. This procedure might require 30 minutes to complete in an FIB.
Semitracks' new and improved Online Training is convenient, up-to-date, and cost effective. Access the same material presented in our courses whenever you need it, right when you need it without having to worry about the high costs and hassle of traveling. The semiconductor field is an ever-changing one. With access to the most current information, you can stay on top of the new technology. Online Training is also very cost effective. For only $500 per year, you gain access to thousands of dollars worth of courses and course material.
Give our Online Training a try – for free. This month's topic is Focused Ion Beam Technology (FIB).
The Focused Ion Beam (FIB) system has become an indispensable tool for failure analysis, design debug, and circuit editing. The FIB allows one to make modifications to a circuit and test them before generating new masks for a chip design. This can save millions of dollars in mask and wafer processing costs. The FIB is also used for TEM sample preparation, cross-sectioning, and other types of micromachining activities.
This segment is no longer available. If this topic interests you, perhaps you would be interested in our Online Training. For more information or to sign up, please visit http://www.semitracks.com/online-training/.
International Reliability Physics Symposium
March 26-30, 2006 at the San Jose McEnery Convention Center in San Jose, CA, USA
To view the AMFA website at http://www.amfaworkshop.org/.
March 31, 2006 at the San Jose McEnery Convention Center in San Jose, CA, USA
Christopher Henderson, President of Semitracks, Inc., will be presenting a paper at this conference.
Semicon West 2006
July 10-14, 2006 at Moscone Center in San Francisco, CA, USA
Focused Ion beam (FIB) systems have been in existence for a little over two decades, but only within the past decade or so have they really made significant contributions in industry. In the early years, FIB systems were primarily used for mask repair. Now they are a boon to the semiconductor industry, the principle user and driving force for FIB development. FIB systems now have numerous and important applications such as carrying out device edits on prototype devices to fix design errors, incorporate last minute changes requested by clients, run experiments, probe circuits for failure analysis (FA), etc. FIB systems can turn around devices in a matter of hours prior to mask changes, and are a boon for performing system and board level checks. Devices can now be worked iteratively until the correct result is achieved. On the analytical side, site-specific sample preparation for scanning and transmission electron microscopes (SEM/TEM) has never been so (relatively) easy and repeatable. Various applications will be discussed.
FIB Technology on February 22, 2006 at SMMS Labs, 2051 Valley View Lane, Farmers Branch, Texas 75234 in Dallas, TX, USA
Note: There are several hotels in the area immediately surrounding the SMMS Labs, including La Quinta Inn, Best Western, Days Inn, Comfort Inn, and several others.
Invest in yourself and your staff. Time is running short to enroll in our Winter courses on Thermal Management, Packing Technology, Packaging Design, and ESD. Come and learn from the experts!
There's still time to sign up for our ESD/Latchup and Packaging courses, only a few spots remain!
IC Packaging Technology and Challenges
Failure and Yield Analysis
Are you new to failure analysis? Does your position require you to have an understanding of failure analysis? Learn about the latest techniques for analyzing complex devices. We have the most comprehensive short course in the industry covering failure analysis. We cover all the techniques from the simple ones (such as Liquid Crystal) all the way to complex ones (such as PICA and Laser Voltage Probing). Learn the secrets of analyzing a component right every time.
Failure and Yield Analysis on April 24-27, 2006 in Austin, TX, USA and on May 15-18, 2006 in Munich, Germany
Reliability is a critical element to the success of any semiconductor product. Reliability margins are increasingly squeezed by today's deep submicron technologies. Learn about the major reliability failure mechanisms, test structures, and test equipment. Learn how to optimize reliability, performance, and cost.
Semiconductor Reliability on May 10-12, 2006 in Munich, Germany
To register for our courses, register online or download the registration form. Fax completed registration form to us at 1-866-205-0713, or call us at 1-505-858-0454 to register by phone.
If you have a suggestion or a comment regarding our courses, online training, discussion forums, reference materials, or if you wish to suggest a new course or location, please feel free to call us at 1-505-858-0454, or e-mail us at firstname.lastname@example.org.
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