RF and Mixed-Signal Testing

Semiconductor and electronics developments continue to proceed at an incredible pace. For example, today's microprocessor chips have one thousand times the processing power of those a decade ago. These challenges have been accomplished because of the integrated circuit industry's ability to track something known as Moore's Law. Moore's Law states that an integrated circuit's processing power will double every two years. This has been accomplished by making devices smaller and smaller.

The industry is also pushing to use semiconductor devices in an increasing array of applications. Many of these applications involve a combination of analog and digital signals that drive actuators, read sensors, and convert these signals into digital data. These applications may also involve wireless signals that transfer data at RF frequencies. To accomplish this, the industry is using an ever-increasing array of mixed-signal components. This has created a number of challenges related to the testing of these components and systems. RF and Mixed-Signal Testing is an 8-hour webinar that offers detailed instruction on the testing of semiconductor components and electronic circuit boards. We place special emphasis on fault models, test techniques, and signal generation. This course is a must for every manager, engineer, and technician working in mixed-signal semiconductor test, testing circuits in high performance electronic systems, testing printed circuit boards, or supplying test hardware and software tools to the industry.

By focusing on the fundamentals of mixed-signal testing, participants will learn how test programs are designed, written, and implemented. Our instructors work hard to explain semiconductor test without delving heavily into the complex algorithms and computer science that normally accompany this discipline.