Because today's application-specific ICs and microprocessors can contain over 100 million transistors, traditional stuck-at-fault (SAF) defect modeling is a poor model for defects. Other models and strategies are required to catch today's killer defects on integrated circuits. Semitracks' 2-day Defect-Based Testing short course offers detailed instruction on electrical behavior and test strategies for integrated circuits.
March 20-21, 2024 | Munich, Germany
Please note: If you or your company plan to pay by wire transfer, you will be charged a wire transfer fee of USD 45.00.
Please email the printable registration form for public courses to us at the email address on the form to complete your order.
We place special emphasis on electrical behavior, fault models, and test techniques. By focusing on the fundamentals of circuit behavior and the impact of defects on circuit behavior, participants will learn how to design, write, and implement test strategies to catch defects.
The skill-building series is divided into four segments:
Our courses are dynamic. We use a combination of instruction by lecture, problem solving, and question/answer sessions to give you the tools you need to excel in the defect-based testing process. From the very first moments of the seminar until the last sentence of the training, the driving instructional factor is application. The course notes offer hundreds of pages of reference material that you can reference and apply during your daily activities.
Our instructors are internationally recognized experts. Our instructors have years of current and relevant experience in their fields. They're focused on answering your questions and teaching you what you need to know.
Christopher Henderson received his B.S. in Physics from the New Mexico Institute of Mining and Technology and his M.S.E.E. from the University of New Mexico. Chris is the President and one of the founders of Semitracks Inc., a United States-based company that provides education and semiconductor training to the electronics industry.
From 1988 to 2004, Chris worked at Sandia National Laboratories, where he was a Principal Member of Technical Staff in the Failure Analysis Department and Microsystems Partnerships Department. His job responsibilities have included failure and yield analysis of components fabricated at Sandia's Microelectronics Development Laboratory, research into the electrical behavior of defects, and consulting on microelectronics issues for the DoD. He has published over 20 papers at various conferences in semiconductor processing, reliability, failure analysis, and test. He has received two R&D 100 awards and two best paper awards. Prior to working at Sandia, Chris worked for Honeywell, BF Goodrich Aerospace, and Intel. Chris is a member of IEEE and EDFAS (the Electron Device Failure Analysis Society).
At Semitracks, Chris teaches courses on failure and yield analysis, semiconductor reliability, and other aspects of semiconductor technology.
Dr. Michael Bruce received a B.S. and Ph.D. in Physics from the University of Texas at Austin. After a post-doctoral at Indiana University, he joined Advanced MicroDevices, Inc. in 1995. He now has over 15 years experience in failure analysis and design debug of microprocessors. He helped pioneer the backside failure analysis field with development of optical techniques like RIL/SDL and single-element Time Resolved Emission. Dr. Bruce holds 74 patents and has published numerous papers related to failure analysis and design debug, including a best paper and an outstanding paper at ISTFA for RIL and SDL, respectively. He has chaired and given many tutorials at IRPS, ISTFA, and IPFA, as well as given many lectures at universities and technical seminars. He currently works as an independent consultant, helping customers understand and implement new FA technologies.
Dr. Aitken has spent the last 15 years working on various aspects of IC design for testability. His current responsibilities include design and test methodology for Artisan's Libraries (Artisan is now a part of ARM Ltd). He has worked in a variety of areas relating to test, including test synthesis, fault modeling, IDDQ testing, and fault diagnosis, as well as contributing to numerous proprietary and/or patented technologies for Agilent's IC business. Additionally, Dr. Aitken has published over 40 technical papers on testing and diagnosis and received the best paper award from the International Test Conference in 1992. He holds a Ph.D. from McGill University in Canada. In addition to being a member of the IEEE and an associate editor of IEEE Transactions on Computer-Aided Design, Dr. Aitken serves on several program committees, including that of International Test Conference. He has also served on the executive committee of the International Conference on CAD and the International Test Synthesis Workshop.