Manuals

We make the manuals available for several of the courses we teach. See below for available manuals.

CMOS and BiCMOS Process Integration

The Process Integration Manual is a must for anyone interested in silicon devices, wafer preparation, yield considerations, etc. The manual contains over 800 slides of text and diagrams. Authored by Badih El-Kareh.

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Item

CMOS and BiCMOS Process Integration Manual

Cost

$295

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Please fax the printable purchasing form for books, manuals and notes to us at 1-866-205-0713 to complete your order.

Failure and Yield Analysis

The Failure and Yield Analysis Manual is a comprehensive manual that is a must for everyone who performs failure and yield analysis or interfaces with these activities. The manual contains over 700 pages of text and diagrams that describe the failure analysis process and the tools and techniques used in failure and yield analysis. Authored by Christopher L. Henderson, Daniel L. Barton, Edward I. Cole, and Michael P. Strizich.

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Item

Failure and Yield Analysis Manual

Cost

$495

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Pay Via Purchase Order/Check

Please fax the printable purchasing form for books, manuals and notes to us at 1-866-205-0713 to complete your order.

Semiconductor Reliability

The Semiconductor Reliability Manual provides an overview of the semiconductor reliability discipline. Subjects such as electromigration, hot carrier effects, stress-induced voiding, ionic contamination, package reliability, EOS/ESD, and more are covered. The manual also covers a basic treatment of statistics for semiconductor reliability. The manual is over 600 pages and is authored by Christopher L. Henderson and Thomas M. Moore.

Purchase

Item

Semiconductor Reliability Manual

Cost

$495

Pay Via Credit Card

Add To Shopping Cart

Pay Via Purchase Order/Check

Please fax the printable purchasing form for books, manuals and notes to us at 1-866-205-0713 to complete your order.