Semiconductor Reliability Manual
The Semiconductor Reliability Manual provides an overview of the semiconductor reliability discipline. Subjects such as electromigration, hot carrier effects, stress-induced voiding, ionic contamination, package reliability, EOS/ESD, and more are covered. The manual also covers a basic treatment of statistics for semiconductor reliability. The manual is over 600 pages and is authored by Christopher L. Henderson and Thomas M. Moore.
Pricing
| Description | SKU # | Price |
| Semiconductor Reliability Manual | sku-1 | $495.00 |
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