Low power analog circuit design is increasingly needed in today's electronic systems. Power conservation is necessary, not only for mobile systems, but also for desktop computing and other applications. For instance, low power analog circuits are a critical element of solar power systems and energy conversion. Analog circuit design is covered by many universities and trade schools, but many of the important issues in analog circuit test are not covered in detail. In low power analog circuits, noise and efficiency are critical. Engineers require an in-depth understanding of analog circuit test in order to effectively assess a circuit's functionality, yield, and resolve potential problems. The industry needs competent designers and test engineers to address these problems. Analog Mixed-Signal Testing is a course that offers detailed instruction on design and test issues related to today's analog circuits. We spend considerable time teaching engineers and technicians how to characterize analog circuits to make sure they work properly in the application. This course is designed for every engineer and technician working on semiconductor designs, troubleshooting systems with analog circuits, and developing low power circuits.
Add To Shopping Cart
Please fax the printable registration form for public courses to us at 1-866-205-0713 to complete your order.
By incorporating the design and simulation tools in the course, participants will learn the software as well as the test process and techniques. Participants also learn the skills to evaluate an analog circuit test program so that they can troubleshoot it or suggest methods to improve the design and/or test program. This skill-building series is divided into four segments:
Martin Versen studied physics at the Ruhr-University Bochum, Germany and received his PhD in 2000 in electrical engineering for his work on single electron devices based on InAs quantum dots. He joined Qimonda's mother company, Infineon Technolgies, in 2000 as product engineer in Munich, Germany, and Williston, VT being responsible for test coverage and customer return analysis in the commodity memory department. He was a senior staff engineer product and test and team leader of the root-cause analysis team in Munich from 2005 to 2009. Since 2009 has has been a professor of Engineering Sciences at The Rosenheim University of Applied Sciences.